Publications

• A family of white-box models for estimating software reliability, Mei-Hwa Chen, J. R. Horgan, Aditya P. Mathur, and Vernon J. Rego, Fourteenth Minnowbrook Workshop on Software Engineering, Jun., New York, 1991.

• Effect of testing techniques on software reliability estimates obtained using time-domain models, Mei-Hwa Chen, Aditya P. Mathur, and Vernon J. Rego, Tenth Annual Software Reliability Symposium, Jun. Colorado, 1992.

• A time/structure based model for estimating software reliability Tech. Report SERC-TR-117-P, Purdue University, July, 1992.

• TERSE : A tool for evaluating software reliability models, Mei-Hwa Chen, Aditya P. Mathur, and Vernon J. Rego, IEEE Fourth International Symposium on Software Reliability Engineering, Nov. 3-6, Colorado, 1993.

• A case study to investigate sensitivity of reliability estimates to errors in operational profile, Mei-Hwa Chen, Aditya P. Mathur, and Vernon J. Rego, IEEE Fifth International Symposium on Software Reliability Engineering, Nov. 6-9, California, 1994.

• Effect of testing techniques on software reliability estimates obtained using a time-domain model Mei-Hwa Chen, Aditya P. Mathur, and Vernon J. Rego, IEEE Transactions on Reliability, Vol.44, No.1, pp 97-103, March 1995.

• Investigating Coverage-Reliability Relationship and Sensitivity of Reliability Estimates to Errors in the Operational Profile Mei-Hwa Chen, Praeit Garg, Aditya P. Mathur, and Vernon J. Rego, Computer Science and Informatics Journal - Special Issue on Software Engineering, Vol. 25, NO. 3, pp 4-16, September 1995.

• An Empirical Study of the Correlation between Coverage and Reliability Estimation Mei-Hwa Chen, Michael R. Lyu and W. Eric Wong, IEEE Third International Symposium on Software Metrics, Mar. 25-26, Berlin, Germany, 1996.

• Effect of Code Coverage on Software Reliability Measurement Mei-Hwa Chen, Michael R. Lyu and W. Eric Wong, submitted to IEEE Transcations on Reliability.

Co-Authors

• Vernon J. Rego, Purdue University

• Aditya P. Mathur, Purdue University

• J. R. Horgan, Bellcore

• W. Eric Wong, Bellcore

• Michael R. Lyu, AT&T, Bell Lab.